Search for: [Abstrakt = "Chromium layers were vapor deposited under ultrahigh vacuum onto samples cut out of a single crystal of 6H\-SiC\(0001\) that were Ar\+ bombardment modified. The substrates and electrical contacts formed by the Cr adlayer were characterized in situ by current\-sensing atomic force microscopy \(CS\-AFM\) and X\-ray photoelectron spectroscopy \(XPS\). Cr\/SiC contacts reveal a good I–V characteristic linearity without the use of heavy impurity doping and high\-temperature annealing."]

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