@misc{Grodzicki_Miłosz_Cr_2009,
 author={Grodzicki, Miłosz and Chrzanowski, Jan and Mazur, Piotr and Zuber, Stefan and Ciszewski, Antoni},
 contributor={Gaj, Miron. Redakcja and Urbańczyk, Wacław. Redakcja},
 year={2009},
 rights={Wszystkie prawa zastrzeżone (Copyright)},
 publisher={Oficyna Wydawnicza Politechniki Wrocławskiej},
 description={Optica Applicata, Vol. 39, 2009, nr 4, s. 765-772},
 language={eng},
 abstract={Chromium layers were vapor deposited under ultrahigh vacuum onto samples cut out of a single crystal of 6H-SiC(0001) that were Ar+ bombardment modified. The substrates and electrical contacts formed by the Cr adlayer were characterized in situ by current-sensing atomic force microscopy (CS-AFM) and X-ray photoelectron spectroscopy (XPS). Cr/SiC contacts reveal a good I–V characteristic linearity without the use of heavy impurity doping and high-temperature annealing.},
 title={Cr ohmic contact on an Ar+ ion modified 6H-SiC(0001) surface},
 type={artykuł},
 keywords={optyka, silicon carbide, chromium, electric contacts, AFM},
}