@misc{Ochalski_Tomasz_J._Thermoreflectance_2005, author={Ochalski, Tomasz J. and Piwoński, Tomasz and Wawer, Dorota and Pierściński, Kamil and Bugajski, Maciej and Kozłowska, Anna and Maląg, Andrzej and Tomm, Jens W.}, contributor={Gaj, Miron. Redakcja and Wilk, Ireneusz. Redakcja}, year={2005}, rights={Wszystkie prawa zastrzeżone (Copyright)}, publisher={Oficyna Wydawnicza Politechniki Wrocławskiej}, description={Optica Applicata, Vol. 35, 2005, nr 3, s. 479-484}, language={eng}, abstract={In this paper we describe a number of optical techniques suitable for estimation of the semiconductor surface temperature. High spatially resolved thermoreflectance will be shown as a powerful tool to measure temperature distribution at the laser diode front facet. For determination of the absolute value of the front facet temperature we use micro-Raman spectroscopy. Both techniques will be presented as a complementary ways to determine surface temperature distribution on the working laser diode.}, title={Thermoreflectance and micro-Raman measurements of the temperature distributions in broad contact laser diodes}, type={artykuł}, keywords={optyka, thermoreflectance, Raman spectroscopy, semiconductor laser}, }