@misc{Wawer_Dorota_Analysis_2005, author={Wawer, Dorota and Tomm, Jens W. and Pierściński, Kamil and Bugajski, Maciej}, contributor={Gaj, Miron. Redakcja and Wilk, Ireneusz. Redakcja}, year={2005}, rights={Wszystkie prawa zastrzeżone (Copyright)}, publisher={Oficyna Wydawnicza Politechniki Wrocławskiej}, description={Optica Applicata, Vol. 35, 2005, nr 3, s. 555-560}, language={eng}, abstract={Spatially resolved micro-Raman measurements have been performed to determine temperature distribution over the facet of high power semiconductor diode lasers. This technique is non-invasive and allows one to study the local temperature on the surface of the mirror of semiconductor diode lasers under normal operating conditions. The micro-Raman measurements can also serve as a calibration of absolute temperature for the other contact-less thermometric methods, e.g., thermoreflectance.}, title={Analysis of high-power diode laser thermal properties by micro-Raman spectroscopy}, type={artykuł}, keywords={optyka, Raman spectroscopy, catastrophic optical mirror damage (COMD), high-power laser, thermoreflectance}, }