Utilization of the cyclic interferometer in polarization phase-shifting technique to determine the thickness of transparent thin-films - Kaewon, Rapeepan; Pawong, Chutchai; Chitaree, Ratchapak; Lertvanithphol, Tossaporn; Bhatranand, Apichai (Oficyna Wydawnicza Politechniki Wrocławskiej, 2020)
Optica Applicata, Vol. 50, 2020, nr 1, s. 69-81
Keywords: optyka; polarization phase-shifting technique; cyclic interferometric configuration; non-destructive thickness measurements; transparent thin-films