Reflection, transmission and ellipsometric parameters of the multilayer structure using a bi-characteristic-impedance transmission line approach - Taya, Sofyan A.; Abu Nasr, Mustafa H.; El-Agez, Taher M. (Oficyna Wydawnicza Politechniki Wrocławskiej, 2013)
Optica Applicata, Vol. 43, 2013, nr 4, s. 817-829
Keywords: optyka; bi-characteristic-impedance transmission line; reflectance; Bragg reflector; ellipsometry