An on-line phase measuring profilometry based on modulation - Yingchun, Wu; Yiping, Cao; Mingteng, Lu; Kun, Li (Oficyna Wydawnicza Politechniki Wrocławskiej, 2012)
Optica Applicata, Vol. 42, 2012, Nr 1, s. 31-41
Keywords: optyka; on-line inspection; phase measuring profilometry (PMP); Stoilov’s algorithm; pixel matching; modulation