Thermal stability of the Cu/Ni multilayer system in X-ray diffraction and scanning microscopy examinations - Kucharska, Barbara; Kulej, Edyta; Wróbel, Anna (Oficyna Wydawnicza Politechniki Wrocławskiej, 2012)
Optica Applicata, Vol. 42, 2012, Nr 4, s. 725-736
Keywords: optyka; Cu/Ni multilayer; thermal stability; X-ray technique