TY - GEN N1 - Optica Applicata, Vol. 36, 2006, nr 2-3, s. 339-349 N2 - We have developed a new technique for monitoring the facet heating in semiconductor lasers and for correlating these measurements with the performance and reliability of the device. The method is based on thermoreflectance, which is a modulation technique relying on periodic facet temperature modulation induced by pulsed current supply of the laser. The periodic temperature change of the laser induces variation of the refractive index and consequently modulates the probe beam reflectivity. The technique has a spatial resolution of about 1 mm and temperature resolution better than 1 K, and can be used for temperature mapping over a 300 mm × 300 mm area. It can be applied to any kind of edge emitting lasers or laser bars. The technique is crucial for understanding the thermal behavior of a device. L1 - http://dbc.wroc.pl/Content/63596/optappl_3623p339.pdf M3 - artykuł L2 - http://dbc.wroc.pl/Content/63596 PY - 2006 KW - optyka KW - thermoreflectance KW - semiconductor lasers C1 - Wszystkie prawa zastrzeżone (Copyright) A1 - Bugajski, Maciej A1 - Ochalski, Tomasz A1 - Piwoński, Tomasz A1 - Wawer, Dorota A2 - Gaj, Miron. Redakcja A2 - Wilk, Ireneusz. Redakcja PB - Oficyna Wydawnicza Politechniki Wrocławskiej C6 - Dla wszystkich w zakresie dozwolonego użytku LA - eng CY - Wrocław T1 - Application of spatially resolved thermoreflectance for the study of facet heating in high power semiconductor lasers UR - http://dbc.wroc.pl/dlibra/publication/edition/63596 ER -