TY - GEN N1 - Optica Applicata, Vol. 35, 2005, nr 3, s. 479-484 N2 - In this paper we describe a number of optical techniques suitable for estimation of the semiconductor surface temperature. High spatially resolved thermoreflectance will be shown as a powerful tool to measure temperature distribution at the laser diode front facet. For determination of the absolute value of the front facet temperature we use micro-Raman spectroscopy. Both techniques will be presented as a complementary ways to determine surface temperature distribution on the working laser diode. L1 - http://dbc.wroc.pl/Content/72836/optappl_3503p479.pdf M3 - artykuł L2 - http://dbc.wroc.pl/Content/72836 PY - 2005 KW - optyka KW - thermoreflectance KW - Raman spectroscopy KW - semiconductor laser C1 - Wszystkie prawa zastrzeżone (Copyright) A1 - Ochalski, Tomasz J. A1 - Piwoński, Tomasz A1 - Wawer, Dorota A1 - Pierściński, Kamil A1 - Bugajski, Maciej A1 - Kozłowska, Anna A1 - Maląg, Andrzej A1 - Tomm, Jens W. A2 - Gaj, Miron. Redakcja A2 - Wilk, Ireneusz. Redakcja PB - Oficyna Wydawnicza Politechniki Wrocławskiej C6 - Dla wszystkich w zakresie dozwolonego użytku LA - eng CY - Wrocław T1 - Thermoreflectance and micro-Raman measurements of the temperature distributions in broad contact laser diodes UR - http://dbc.wroc.pl/dlibra/publication/edition/72836 ER -