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Title:

Uncertainty of atomic force microscopy measurements

Group publication title:

Optica Applicata

Creator:

Gotszalk, Teodor P. ; Janus, Paweł ; Marendziak, Andrzej ; Szeloch, Roman F.

Contributor:

Gaj, Miron. Redakcja

Subject and Keywords:

optyka ; uncertainty of measurement ; atomic force microscopy (AFM)

Description:

Optica Applicata, Vol. 37, 2007, nr 4, s. 397-403

Abstrakt:

We consider the problem of uncertainty in geometrically linear measurements in scanning probe microscopy (SPM) represented by atomic force microscopy (AFM). The uncertainties under consideration are associated both with quantum phenomena in the space cantilever tip–sample surfaces and with effects of dynamic behavior of electronic and optic measurement and control systems. In our experiment, we have analyzed uncertainty of calibrated atomic force microscopy (C-AFM) measurement in two dimensions. Uncertainty of measurements has been estimated according to GUM procedure.

Publisher:

Oficyna Wydawnicza Politechniki Wrocławskiej

Place of publication:

Wrocław

Date:

2007

Resource Type:

artykuł

Source:

<sygn. PWr A3481II> ; click here to follow the link ; click here to follow the link

Language:

eng

Relation:

Optica Applicata ; Optica Applicata, Vol. 37, 2007 ; Optica Applicata, Vol. 37, 2007, nr 4 ; Politechnika Wrocławska. Wydział Podstawowych Problemów Techniki

Rights:

Wszystkie prawa zastrzeżone (Copyright)

Access Rights:

Dla wszystkich w zakresie dozwolonego użytku

Location:

Politechnika Wrocławska