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Title:

Optical characterisation of vertical-external-cavity surface-emitting lasers (VECSELs)

Group publication title:

Optica Applicata

Creator:

Wójcik-Jedlińska, Anna ; Pierściński, Kamil ; Jasik, Agata ; Muszalski, Jan ; Bugajski, Maciej

Contributor:

Gaj, Miron. Redakcja

Subject and Keywords:

optyka ; vertical-external-cavity surface-emitting laser (VECSEL) ; DBR ; quantum well ; semiconductor laser ; photoluminescence ; reflectance

Description:

Optica Applicata, Vol. 37, 2007, nr 4, s. 449-457

Abstrakt:

The purpose of this paper is to outline the principles of optical characterisation of the new kind of semiconductor devices: vertical-external-cavity surface-emitting lasers (VECSELs). Realisation of high efficiency semiconductor devices requires high accuracy of epitaxial process. Gain characteristic of VECSEL structure is strongly affected by the precise placing of the quantum wells within the multilayer structure. Detailed optical characterisation of particular parts of the structure allows growth errors to be identified and gives insight into the lasing behaviour. In this work, we present an approach taking advantage of two spectroscopic techniques, photoluminescence and reflectance measurements, to study properties of VECSEL structure based on InGaAs/GaAs active region, designed for emission wavelength at 980 nm.

Publisher:

Oficyna Wydawnicza Politechniki Wrocławskiej

Place of publication:

Wrocław

Date:

2007

Resource Type:

artykuł

Source:

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Language:

eng

Relation:

Optica Applicata ; Optica Applicata, Vol. 37, 2007 ; Optica Applicata, Vol. 37, 2007, nr 4 ; Politechnika Wrocławska. Wydział Podstawowych Problemów Techniki

Rights:

Wszystkie prawa zastrzeżone (Copyright)

Access Rights:

Dla wszystkich w zakresie dozwolonego użytku

Location:

Politechnika Wrocławska