Object structure
Title:

Thermoreflectance and micro-Raman measurements of the temperature distributions in broad contact laser diodes

Group publication title:

Optica Applicata

Creator:

Ochalski, Tomasz J. ; Piwoński, Tomasz ; Wawer, Dorota ; Pierściński, Kamil ; Bugajski, Maciej ; Kozłowska, Anna ; Maląg, Andrzej ; Tomm, Jens W.

Contributor:

Gaj, Miron. Redakcja ; Wilk, Ireneusz. Redakcja

Subject and Keywords:

optyka ; thermoreflectance ; Raman spectroscopy ; semiconductor laser

Description:

Optica Applicata, Vol. 35, 2005, nr 3, s. 479-484

Abstrakt:

In this paper we describe a number of optical techniques suitable for estimation of the semiconductor surface temperature. High spatially resolved thermoreflectance will be shown as a powerful tool to measure temperature distribution at the laser diode front facet. For determination of the absolute value of the front facet temperature we use micro-Raman spectroscopy. Both techniques will be presented as a complementary ways to determine surface temperature distribution on the working laser diode.

Publisher:

Oficyna Wydawnicza Politechniki Wrocławskiej

Place of publication:

Wrocław

Date:

2005

Resource Type:

artykuł

Source:

<sygn. PWr A3481II> ; click here to follow the link ; click here to follow the link

Language:

eng

Relation:

Optica Applicata ; Optica Applicata, Vol. 35, 2005 ; Optica Applicata, Vol. 35, 2005, nr 3 ; Politechnika Wrocławska. Wydział Podstawowych Problemów Techniki

Rights:

Wszystkie prawa zastrzeżone (Copyright)

Access Rights:

Dla wszystkich w zakresie dozwolonego użytku

Location:

Politechnika Wrocławska

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