Title:

Measurement and statistical modeling of BRDF of various samples

Group publication title:

Optica Applicata

Creator:

Zhang, Hanlu ; Wu, Zhensen ; Cao, Yunhua ; Zhang, Geng

Contributor:

Gaj, Miron. Redakcja ; Urbańczyk, Wacław. Redakcja

Subject and Keywords:

optyka ; bidirectional reflectance distribution function (BRDF) ; modeling ; measurement ; light scattering

Description:

Optica Applicata, Vol. 40, 2010, nr 1, s. 197-208

Abstrakt:

Based on the Torrance–Sparrow model, a modified and simplified five-parameter model is obtained. Multi-angle bistatic reflectance data of surfaces of various materials are fitted using this model. Genetic algorithm is used to optimize the parameters for the model. The results of the five-parameter model are in good agreement with experimental data which do not take part in fitting, and are close to the results of two-dimensional bidirectional reflectance distribution function (BRDF) models. The five-parameter model shows a good applicability to various rough surfaces with different surface optical properties. The five-parameter model can be used to construct a three-dimensional BRDF distribution based on the spatial experimental data, which may provide more information on light scattering from rough surfaces.

Publisher:

Oficyna Wydawnicza Politechniki Wrocławskiej

Place of publication:

Wrocław

Date:

2010

Resource Type:

artykuł

Source:

<sygn. PWr A3481II> ; click here to follow the link ; click here to follow the link

Language:

eng

Relation:

Optica Applicata ; Optica Applicata, Vol. 40, 2010 ; Optica Applicata, Vol. 40, 2010, nr 1 ; Politechnika Wrocławska. Wydział Podstawowych Problemów Techniki

Rights:

Wszystkie prawa zastrzeżone (Copyright)

Access Rights:

Dla wszystkich w zakresie dozwolonego użytku

Location:

Politechnika Wrocławska