Title:

Studies of polymer surface topography by means of optical profilometry

Group publication title:

Optica Applicata

Creator:

Jaglarz, Janusz ; Sanetra, Jerzy ; Cisowski, Jan

Contributor:

Gaj, Miron. Redakcja ; Urbańczyk, Wacław. Redakcja

Subject and Keywords:

optyka ; optical profilometry ; thin polymeric films

Description:

Optica Applicata, Vol. 40, 2010, nr 4, s. 767-772

Abstrakt:

The optical reflection measurements of polyvinylocarbazole (PVK) and polyazomethine (PPI) thin films have been done by means of optical profilometry (OP) exhibiting many advantages in surface and subsurface investigations. The obtained OP images clearly demonstrate that the thickness of the polymer films under investigation is not uniform over their lateral dimensions. For the PVK thin film, the fast Fourier transform (FFT) in the inverse space of the OP image is also presented along with distribution of the surface highs.

Publisher:

Oficyna Wydawnicza Politechniki Wrocławskiej

Place of publication:

Wrocław

Date:

2010

Resource Type:

artykuł

Source:

<sygn. PWr A3481II> ; click here to follow the link ; click here to follow the link

Language:

eng

Relation:

Optica Applicata ; Optica Applicata, Vol. 40, 2010 ; Optica Applicata, Vol. 40, 2010, nr 4 ; Politechnika Wrocławska. Wydział Podstawowych Problemów Techniki

Rights:

Wszystkie prawa zastrzeżone (Copyright)

Access Rights:

Dla wszystkich w zakresie dozwolonego użytku

Location:

Politechnika Wrocławska