Title:
Studies of polymer surface topography by means of optical profilometry
Group publication title:
Creator:
Jaglarz, Janusz ; Sanetra, Jerzy ; Cisowski, Jan
Contributor:
Gaj, Miron. Redakcja ; Urbańczyk, Wacław. Redakcja
Subject and Keywords:
optyka ; optical profilometry ; thin polymeric films
Description:
Optica Applicata, Vol. 40, 2010, nr 4, s. 767-772
Abstrakt:
The optical reflection measurements of polyvinylocarbazole (PVK) and polyazomethine (PPI) thin films have been done by means of optical profilometry (OP) exhibiting many advantages in surface and subsurface investigations. The obtained OP images clearly demonstrate that the thickness of the polymer films under investigation is not uniform over their lateral dimensions. For the PVK thin film, the fast Fourier transform (FFT) in the inverse space of the OP image is also presented along with distribution of the surface highs.
Publisher:
Oficyna Wydawnicza Politechniki Wrocławskiej
Place of publication:
Date:
Resource Type:
Source:
<sygn. PWr A3481II> ; click here to follow the link ; click here to follow the link
Language:
Relation:
Optica Applicata ; Optica Applicata, Vol. 40, 2010 ; Optica Applicata, Vol. 40, 2010, nr 4 ; Politechnika Wrocławska. Wydział Podstawowych Problemów Techniki
Rights:
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