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- Lower Silesian Digital Library > Participants of the Consortium > 01. Wrocław University of Technology > Journals WUoT > Journals published at Wrocław University of Technology > Optica Applicata
- Lower Silesian Digital Library > Resources > 2. Czasopisma > Czasopisma współczesne
- Lower Silesian Digital Library > Fields of science > 6. Nauki ścisłe i przyrodnicze
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Jan 16, 2019
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Jul 9, 2018
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Optica Applicata
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Optica Applicata, Vol. 1, 1971
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Optica Applicata, Vol. 2, 1972
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Optica Applicata, Vol. 3, 1973
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Optica Applicata, Vol. 4, 1974
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Optica Applicata, Vol. 5, 1975
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Optica Applicata, Vol. 6, 1976
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Optica Applicata, Vol. 7, 1977
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Optica Applicata, Vol. 8, 1978
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Optica Applicata, Vol. 9, 1979
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Optica Applicata, Vol. 10, 1980
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Optica Applicata, Vol. 11, 1981
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Optica Applicata, Vol. 11, 1981, nr 1
- Contents [Optica Applicata, Vol. 11, 1981, nr 1]
- Theoretical and experimental treatments of discharge current modulation of output of a CO₂ laser
- Improvement of recording linearity of Fourier transform holograms by using a random phase modulator with the spectrum shaped by spatial filtering
- Spectrum transfer of one-dimensional periodic object in optical systems with nonuniformly slit-like aperture
- Beam deformations of high power laser radiation during passage through imaging optical elements
- An application of the multidimensional regression to examination of size distribution of the dust particles by photometric measurements of the related diffraction patterns
- Some optical properties of planar light waveguides formed by silver-ion diffusion in glass
- Theory and applications of the far field double diffraction on the progressing spatial phase modulation and stationary amplitude grating
- On the role of the instrumental function of an entrance monochromator in the interferometric line profile analysis
- The ABCD-matrix for holographic gratings
- Optical noises in amplitude holography, developed by nonlinear properties of recording media
- Spatial pulse response in photographic relief images
- Luminescence method of examination of 3d level structure of Mn²⁺ions in glasses
- Image recognition in diffraction intensity correlators
- A digital Fabry-Perot spectrometer for the use in studies of pressure broadening and shift of spectral lines
- Field curvature and astigmatism in holographic imaging
- Producing of tolerance gaps by spatial filtering
- Letter to the Editor: An algorithm for determining the optical constants and thicknesses of thin absorbing layers from the ellipsometric measurements
- Book Reviews [Optica Applicata, Vol. 11, 1981, nr 1]
- Meeting Report: The 1980 European Optical Conference
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Optica Applicata, Vol. 11, 1981, nr 2
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Optica Applicata, Vol. 11, 1981, nr 3
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Optica Applicata, Vol. 11, 1981, nr 4
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Optica Applicata, Vol. 11, 1981, nr 1
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Optica Applicata, Vol. 12, 1982
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Optica Applicata, Vol. 13, 1983
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Optica Applicata, Vol. 14, 1984
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Optica Applicata, Vol. 15, 1985
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Optica Applicata, Vol. 16, 1986
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Optica Applicata, Vol. 17, 1987
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Optica Applicata, Vol. 18, 1988
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Optica Applicata, Vol. 19, 1989
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Optica Applicata, Vol. 20, 1990
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Optica Applicata, Vol. 21, 1991
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Optica Applicata, Vol. 22, 1992
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Optica Applicata, Vol. 23, 1993
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Optica Applicata, Vol. 24, 1994
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Optica Applicata, Vol. 25, 1995
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Optica Applicata, Vol. 26, 1996
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Optica Applicata, Vol. 27, 1997
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Optica Applicata, Vol. 28, 1998
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Optica Applicata, Vol. 29, 1999
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Optica Applicata, Vol. 30, 2000
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Optica Applicata, Vol. 31, 2001
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Optica Applicata, Vol. 32, 2002
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Optica Applicata, Vol. 33, 2003
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Optica Applicata, Vol. 34, 2004
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Optica Applicata, Vol. 35, 2005
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Optica Applicata, Vol. 36, 2006
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Optica Applicata, Vol. 37, 2007
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Optica Applicata, Vol. 38, 2008
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Optica Applicata, Vol. 39, 2009
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Optica Applicata, Vol. 40, 2010
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Optica Applicata, Vol. 41, 2011
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Optica Applicata, Vol. 42, 2012
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Optica Applicata, Vol. 43, 2013
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Optica Applicata, Vol. 44, 2014
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Optica Applicata, Vol. 45, 2015
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Optica Applicata, Vol. 46, 2016
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Optica Applicata, Vol. 47, 2017
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Optica Applicata, Vol. 1, 1971
| Edition name | Date |
|---|---|
| On the role of the instrumental function of an entrance monochromator in the interferometric line profile analysis | Jan 16, 2019 |
