Object

Title: Thin film thickness determination using X-ray reflectivity and Savitzky–Golay algorithm

Object collections:

Last modified:

Jan 16, 2019

In our library since:

Dec 12, 2018

Number of object content hits:

34

Number of object content views in PDF format

33

All available object's versions:

https://dbc.wroc.pl/publication/95185

Show description in RDF format:

RDF

Show description in OAI-PMH format:

OAI-PMH

Objects

Similar

This page uses 'cookies'. More information