Object

Title: The principle of multilayer plane-parallel structure antireflection

Creator:

Kosoboutskyy, Petro ; Karkulovska, Mar’yana ; Morgulis, Alla

Description:

Optica Applicata, Vol. 40, 2010, nr 4, s. 759-765

Publisher:

Oficyna Wydawnicza Politechniki Wrocławskiej

Place of publication:

Wrocław

Contributor:

Gaj, Miron. Redakcja ; Urbańczyk, Wacław. Redakcja

Date:

2010

Resource Type:

artykuł

Resource Identifier:

oai:dbc.wroc.pl:58485

Source:

<sygn. PWr A3481II> ; click here to follow the link ; click here to follow the link

Language:

eng

Relation:

Optica Applicata ; Optica Applicata, Vol. 40, 2010 ; Optica Applicata, Vol. 40, 2010, nr 4 ; Politechnika Wrocławska. Wydział Podstawowych Problemów Techniki

Location:

Politechnika Wrocławska

Abstrakt:

The principle of two- and three-layer transparent system antireflection is based on the method of Fabry–Perot multiple-beam interference spectrum envelopes and it is shown that the presence of half-wave and quarter-wave layer thicknesses or their combination is sufficient but not necessary for its achievement. The necessary condition is the condition of overlapping of interference layer envelopes, therefore the antireflection effect can be observed at arbitrary ratios of optical layer thicknesses, angles of incidence and optical refraction index of media when the condition is satisfied for the minimum of interference contour in the required spectral region.

Rights:

Wszystkie prawa zastrzeżone (Copyright)

Access Rights:

Dla wszystkich w zakresie dozwolonego użytku

Group publication title:

Optica Applicata

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