Object

Title: Studies of polymer surface topography by means of optical profilometry

Creator:

Jaglarz, Janusz ; Sanetra, Jerzy ; Cisowski, Jan

Description:

Optica Applicata, Vol. 40, 2010, nr 4, s. 767-772

Publisher:

Oficyna Wydawnicza Politechniki Wrocławskiej

Place of publication:

Wrocław

Contributor:

Gaj, Miron. Redakcja ; Urbańczyk, Wacław. Redakcja

Date:

2010

Resource Type:

artykuł

Resource Identifier:

oai:dbc.wroc.pl:58486

Source:

<sygn. PWr A3481II> ; click here to follow the link ; click here to follow the link

Language:

eng

Relation:

Optica Applicata ; Optica Applicata, Vol. 40, 2010 ; Optica Applicata, Vol. 40, 2010, nr 4 ; Politechnika Wrocławska. Wydział Podstawowych Problemów Techniki

Location:

Politechnika Wrocławska

Abstrakt:

The optical reflection measurements of polyvinylocarbazole (PVK) and polyazomethine (PPI) thin films have been done by means of optical profilometry (OP) exhibiting many advantages in surface and subsurface investigations. The obtained OP images clearly demonstrate that the thickness of the polymer films under investigation is not uniform over their lateral dimensions. For the PVK thin film, the fast Fourier transform (FFT) in the inverse space of the OP image is also presented along with distribution of the surface highs.

Rights:

Wszystkie prawa zastrzeżone (Copyright)

Access Rights:

Dla wszystkich w zakresie dozwolonego użytku

Group publication title:

Optica Applicata

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