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- Lower Silesian Digital Library > Participants of the Consortium > 01. Wrocław University of Technology > Journals WUoT > Journals published at Wrocław University of Technology > Optica Applicata
- Lower Silesian Digital Library > Resources > 2. Czasopisma > Czasopisma współczesne
- Lower Silesian Digital Library > Fields of science > 6. Nauki ścisłe i przyrodnicze
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Jan 16, 2019
In our library since:
Dec 12, 2018
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385
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366
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https://dbc.wroc.pl/publication/95185
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Optica Applicata
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Optica Applicata, Vol. 1, 1971
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Optica Applicata, Vol. 2, 1972
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Optica Applicata, Vol. 3, 1973
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Optica Applicata, Vol. 4, 1974
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Optica Applicata, Vol. 5, 1975
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Optica Applicata, Vol. 6, 1976
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Optica Applicata, Vol. 7, 1977
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Optica Applicata, Vol. 8, 1978
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Optica Applicata, Vol. 9, 1979
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Optica Applicata, Vol. 10, 1980
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Optica Applicata, Vol. 11, 1981
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Optica Applicata, Vol. 12, 1982
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Optica Applicata, Vol. 13, 1983
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Optica Applicata, Vol. 14, 1984
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Optica Applicata, Vol. 15, 1985
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Optica Applicata, Vol. 16, 1986
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Optica Applicata, Vol. 17, 1987
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Optica Applicata, Vol. 18, 1988
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Optica Applicata, Vol. 19, 1989
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Optica Applicata, Vol. 20, 1990
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Optica Applicata, Vol. 21, 1991
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Optica Applicata, Vol. 22, 1992
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Optica Applicata, Vol. 23, 1993
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Optica Applicata, Vol. 24, 1994
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Optica Applicata, Vol. 25, 1995
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Optica Applicata, Vol. 26, 1996
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Optica Applicata, Vol. 27, 1997
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Optica Applicata, Vol. 28, 1998
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Optica Applicata, Vol. 29, 1999
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Optica Applicata, Vol. 30, 2000
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Optica Applicata, Vol. 31, 2001
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Optica Applicata, Vol. 32, 2002
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Optica Applicata, Vol. 33, 2003
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Optica Applicata, Vol. 34, 2004
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Optica Applicata, Vol. 35, 2005
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Optica Applicata, Vol. 36, 2006
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Optica Applicata, Vol. 37, 2007
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Optica Applicata, Vol. 38, 2008
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Optica Applicata, Vol. 39, 2009
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Optica Applicata, Vol. 40, 2010
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Optica Applicata, Vol. 41, 2011
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Optica Applicata, Vol. 41, 2011, Nr 1
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Optica Applicata, Vol. 41, 2011, Nr 2
- Characterization of AIIIBV epitaxial layers by scanning spreading resistance microscopy
- Electron emission from Spindt-like carbon nanotubes field emission cathodes (FECs)
- Electrical and photoelectric characterization of the MOS structures on 3C–SiC substrate
- Application of AFM technique for creation of patterns in nanoscale
- Thin film thickness determination using X-ray reflectivity and Savitzky–Golay algorithm
- Radio frequency modulation of semiconductor laser as an improvement method of noise performance of scanning probe microscopy position sensitive detectors
- Planar silicon structure in application to the modulation of infrared radiation
- Field electron emitters made of plasma sprayed layers
- Optical channel structures based on sol–gel derived waveguide films
- Spectroscopic investigations of rare-earth materials for luminescent solar concentrators
- Section of gradient index multimode fiber as an elementary fiber grin lens
- Carbon nanotube transparent conductive layers for solar cells applications
- Low temperature co-fired ceramics (LTCC) microsystems
- Vacuum in microsystems – generation and measurement
- Microfluidic preconcentrator and microfluidic chip for bacterial cells detection
- Optoelectronic bacteria cells detection system
- Injection, separation and fluorimetric detection of DNA in glass lab-on-a-chip for capillary gel electrophoresis
- Lab-on-a-chip for quality classification of pig oocytes
- Micromirrors inclined at 45° towards Si substrates fabricated by anisotropic etching
- Electrical and optical properties of NiO films deposited by magnetron sputtering
- Analysis of chemical shifts in Auger electron spectra versus sputtering time from passivated surfaces
- X-ray, AFM, UV–VIS–IR analysis of a-Si:H/μc-Si:H supperlattice structure
- Electron radiation effects on RuO2-based thick-film temperature sensors
- Structural and optical properties of vanadium oxides prepared by microwave-assisted reactive magnetron sputtering
- The low temperature co-fired ceramics (LTCC) chip for polymerase chain reaction (PCR) application
- Studies of rejuvenation of electroluminescent thick film structures
- The role of antireflective coatings in silicon solar cells – the influence on their electrical parameters
- Hybrid sol–gel–glaze planar optical waveguides on LTCC substrate – preliminary works
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Optica Applicata, Vol. 41, 2011, Nr 3
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Optica Applicata, Vol. 41, 2011, Nr 4
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Optica Applicata, Vol. 41, 2011, Nr 1
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Optica Applicata, Vol. 42, 2012
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Optica Applicata, Vol. 43, 2013
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Optica Applicata, Vol. 44, 2014
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Optica Applicata, Vol. 45, 2015
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Optica Applicata, Vol. 46, 2016
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Optica Applicata, Vol. 47, 2017
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Optica Applicata, Vol. 1, 1971
| Edition name | Date |
|---|---|
| Thin film thickness determination using X-ray reflectivity and Savitzky–Golay algorithm | Jan 16, 2019 |
